Thin film transistors with spacer controlled gate length

ABSTRACT

Embodiments herein describe techniques for a semiconductor device including a TFT having a gate electrode with a gate length determined by a spacer. Embodiments may include a gate electrode above a substrate, a channel layer above the gate electrode, and a source electrode, a drain electrode, and a spacer above the channel layer. The drain electrode may be separated from the source electrode by the spacer. The drain electrode and the source electrode may have different widths or include different materials. Furthermore, the spacer may overlap with the gate electrode, hence the gate length of the gate electrode may be determined by the spacer width. Other embodiments may be described and/or claimed.

CROSS REFERENCE TO RELATED APPLICATIONS

The present application is a national phase entry under 35 U.S.C. § 371of International Application No. PCT/US2017/025593, filed Mar. 31, 2017,entitled “THIN FILM TRANSISTORS WITH SPACER CONTROLLED GATE LENGTH”,which designated, among the various States, the United States ofAmerica. The Specifications of the PCT/US2017/025593 Application ishereby incorporated by reference.

FIELD

Embodiments of the present disclosure generally relate to the field ofintegrated circuits, and more particularly, to transistors.

BACKGROUND

A thin-film transistor (TFT) is a kind of field-effect transistorincluding a channel layer, a gate electrode, and source and drainelectrodes, over a supporting but non-conducting substrate. A TFTdiffers from a conventional transistor, where a channel of theconventional transistor is typically within a substrate, such as asilicon substrate. TFTs have emerged as an attractive option to fuelMoore's law by integrating TFTs vertically in the back-end, whileleaving the silicon substrate areas for high-speed transistors. TFTshold great potential for large area and flexible electronics, e.g.,displays. Other applications of TFTs may include memory arrays.

TFTs may be fabricated by bottom gate technologies, where a gateelectrode of a TFT may be patterned before a channel layer is patterned.Often the gate electrode of a TFT may have a gate length related to apitch of the source and drain electrodes. Such a pitch may be determinedby the lithography technology used in patterning and fabricating theTFT. Furthermore, there may be variations between the gate lengths amongmultiple TFTs caused by the edge roughness and variations of the pitchesbetween source and drain electrodes of different TFTs. The variations ofthe gate length may adversely affect the on and off currents of theTFTs.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments will be readily understood by the following detaileddescription in conjunction with the accompanying drawings. To facilitatethis description, like reference numerals designate like structuralelements. Embodiments are illustrated by way of example and not by wayof limitation in the figures of the accompanying drawings.

FIG. 1 schematically illustrates a memory array with multiple memorycells wherein a thin-film transistor (TFT) may be a selector of a memorycell, in accordance with various embodiments.

FIG. 2 schematically illustrates a diagram of a TFT having a gateelectrode with a gate length determined by a spacer, in accordance withsome embodiments.

FIG. 3 schematically illustrates a diagram of two TFTs, wherein a sourceelectrode of a TFT may be separated from a source electrode of anadjacent TFT by a pitch, in accordance with some embodiments.

FIG. 4 illustrates a process for forming a TFT having a gate electrodewith a gate length determined by a spacer, in accordance with someembodiments.

FIG. 5 schematically illustrates an interposer implementing one or moreembodiments of the disclosure, in accordance with some embodiments.

FIG. 6 schematically illustrates a computing device built in accordancewith an embodiment of the disclosure, in accordance with someembodiments.

FIG. 7 schematically illustrates a diagram of a TFT having a gateelectrode with a gate length determined by a spacer and formed inback-end-of-line (BEOL) on a substrate, in accordance with someembodiments.

DETAILED DESCRIPTION

A memory array, e.g., a dynamic random access memory (DRAM), may includea plurality of memory cells, wherein a memory cell may include aselector, e.g., a transistor, to control the access to a storage cell.In embodiments, the storage cell may be a capacitor to store charge,resulting in a 1T1C (one transistor, one capacitor) architecture for thememory cell. When a normal silicon transistor is used as a selector fora memory cell, the transistor may be very leaky, so that the chargestored in a storage cell may not be retained for long due to leakagecaused by the transistor. A relatively large capacitor may be used tostore enough charge for the storage cell, which may take up asignificant substrate area. Sometimes, large capacitors may beimplemented by creating a deep trench in a silicon substrate, making theprocess non-CMOS compatible.

A TFT may be used as a selector of a memory cell in a memory array. WhenTFTs are fabricated by bottom gate technologies, the gate electrode of aTFT may have a gate length related to a pitch of the source and drainelectrodes. Such a pitch may be determined by the lithography technologyused in patterning and fabricating the TFT, which may be relativelylarge. Furthermore, variations between the gate lengths among multipleTFTs caused by the edge roughness and variations of the pitches betweensource and drain electrodes may further adversely affect the on and offcurrents of the TFTs. Hence, the write performance and retention time ofa memory cell may be impacted adversely due to the changes to the on andoff currents of the TFT used as a selector for the memory cell.

Embodiments herein may present techniques to pattern a gate electrode ofa TFT with a gate length determined by a spacer. Embodiments herein mayalso present TFTs with gate lengths shorter than a pitch between sourceand drain electrodes determined by the lithography technology. As aresult, the TFTs may have reduced on and off current change, resultingin improved performance and retention time of the memory cell. Otheradvantages may include reduced current degradation due to larger sourceand drain electrodes, better alignment tolerance to gate and thin filmsemiconductor island, and better tolerance for vias in contact with thesource and drain electrodes of the TFTs.

Embodiments herein may present a semiconductor device, which includes agate electrode above a substrate, a channel layer above the gateelectrode, and a source electrode, a drain electrode, and a spacer abovethe channel layer. The drain electrode may be separated from the sourceelectrode by the spacer. The drain electrode and the source electrodemay be made at different steps and may have different widths. Forexample, the source electrode may have a first width, and the drainelectrode may have a second width different from the first width.Compared to a width of the source electrode, or a pitch between sourceand drain electrodes, the spacer may have a much shorter width.Furthermore, the spacer may overlap with the gate electrode, hence thegate length of the gate electrode may be determined by the spacer widthand reduced as well.

Embodiments herein may present a computing device, which may include acircuit board, and a memory device coupled to the circuit board andincluding a memory array. In more detail, the memory array may include aplurality of memory cells. A memory cell of the plurality of memorycells may include a transistor and a storage cell. The transistor in thememory cell may include a gate electrode coupled to a word line of thememory array, a channel layer above the gate electrode, and a sourceelectrode, a drain electrode, and a spacer, where the source electrode,the drain electrode, and the spacer are above the channel layer. Inaddition, the source electrode may be coupled to a source line of thememory array, the drain electrode may be coupled to the storage cell,and the storage cell may be coupled to a bit line of the memory array.The drain electrode may be separated from the source electrode by thespacer, and the spacer may overlap with the gate electrode. Inembodiments, the source electrode may have a first width, and the drainelectrode may have a second width different from the first width.

In embodiments, a method for forming a semiconductor device may include:forming a gate electrode above a substrate, forming a gate dielectriclayer conformally covering the gate electrode and the substrate, andforming a channel layer above the gate dielectric layer. The method mayalso include forming a source electrode above the channel layer, wherethe source electrode may be separated from another source electrode ofan adjacent transistor by a pitch. The method may further includeforming a spacer next to the source electrode and above the channellayer, where the spacer may overlap with the gate electrode. Inaddition, the method may include forming a drain electrode next to thespacer and above the channel layer. In embodiments, the source electrodemay have a first width, the spacer may have a second width, and thedrain electrode may have a third width, where the sum of the firstwidth, the second width, and the third width may be less than the pitch.Furthermore, since the spacer may overlap with the gate electrode, thegate length of the gate electrode may be determined by the spacer andsmaller than the pitch.

In the following description, various aspects of the illustrativeimplementations will be described using terms commonly employed by thoseskilled in the art to convey the substance of their work to othersskilled in the art. However, it will be apparent to those skilled in theart that the present disclosure may be practiced with only some of thedescribed aspects. For purposes of explanation, specific numbers,materials and configurations are set forth in order to provide athorough understanding of the illustrative implementations. However, itwill be apparent to one skilled in the art that the present disclosuremay be practiced without the specific details. In other instances,well-known features are omitted or simplified in order not to obscurethe illustrative implementations.

Various operations will be described as multiple discrete operations, inturn, in a manner that is most helpful in understanding the presentdisclosure. However, the order of description should not be construed toimply that these operations are necessarily order dependent. Inparticular, these operations may not be performed in the order ofpresentation.

For the purposes of the present disclosure, the phrase “A and/or B”means (A), (B), or (A and B). For the purposes of the presentdisclosure, the phrase “A, B, and/or C” means (A), (B). (C), (A and B),(A and C), (B and C), or (A, B and C).

The terms “over,” “under,” “between,” “above,” and “on” as used hereinmay refer to a relative position of one material layer or component withrespect to other layers or components. For example, one layer disposedover or under another layer may be directly in contact with the otherlayer or may have one or more intervening layers. Moreover, one layerdisposed between two layers may be directly in contact with the twolayers or may have one or more intervening layers. In contrast, a firstlayer “on” a second layer is in direct contact with that second layer.Similarly, unless explicitly stated otherwise, one feature disposedbetween two features may be in direct contact with the adjacent featuresor may have one or more intervening features.

The description may use the phrases “in an embodiment,” or “inembodiments,” which may each refer to one or more of the same ordifferent embodiments. Furthermore, the terms “comprising,” “including,”“having,” and the like, as used with respect to embodiments of thepresent disclosure, are synonymous.

The term “coupled with,” along with its derivatives, may be used herein.“Coupled” may mean one or more of the following. “Coupled” may mean thattwo or more elements are in direct physical or electrical contact.However, “coupled” may also mean that two or more elements indirectlycontact each other, but yet still cooperate or interact with each other,and may mean that one or more other elements are coupled or connectedbetween the elements that are said to be coupled with each other. Theterm “directly coupled” may mean that two or more elements are in directcontact.

In various embodiments, the phrase “a first feature formed, deposited,or otherwise disposed on a second feature” may mean that the firstfeature is formed, deposited, or disposed over the second feature, andat least a part of the first feature may be in direct contact (e.g.,direct physical and/or electrical contact) or indirect contact (e.g.,having one or more other features between the first feature and thesecond feature) with at least a part of the second feature.

Where the disclosure recites “a” or “a first” element or the equivalentthereof, such disclosure includes one or more such elements, neitherrequiring nor excluding two or more such elements. Further, ordinalindicators (e.g., first, second, or third) for identified elements areused to distinguish between the elements, and do not indicate or imply arequired or limited number of such elements, nor do they indicate aparticular position or order of such elements unless otherwisespecifically stated.

As used herein, the term “circuitry” may refer to, be part of, orinclude an Application Specific Integrated Circuit (ASIC), an electroniccircuit, a processor (shared, dedicated, or group), and/or memory(shared, dedicated, or group) that execute one or more software orfirmware programs, a combinational logic circuit, and/or other suitablehardware components that provide the described functionality. As usedherein, “computer-implemented method” may refer to any method executedby one or more processors, a computer system having one or moreprocessors, a mobile device such as a smartphone (which may include oneor more processors), a tablet, a laptop computer, a set-top box, agaming console, and so forth.

Implementations of the disclosure may be formed or carried out on asubstrate, such as a semiconductor substrate. In one implementation, thesemiconductor substrate may be a crystalline substrate formed using abulk silicon or a silicon-on-insulator substructure. In otherimplementations, the semiconductor substrate may be formed usingalternate materials, which may or may not be combined with silicon, thatinclude but are not limited to germanium, indium antimonide, leadtelluride, indium arsenide, indium phosphide, gallium arsenide, indiumgallium arsenide, gallium antimonide, or other combinations of groupIII-V or group IV materials. Although a few examples of materials fromwhich the substrate may be formed are described here, any material thatmay serve as a foundation upon which a semiconductor device may be builtfalls within the spirit and scope of the present disclosure.

A plurality of transistors, such as metal-oxide-semiconductorfield-effect transistors (MOSFET or simply MOS transistors), may befabricated on the substrate. In various implementations of thedisclosure, the MOS transistors may be planar transistors, nonplanartransistors, or a combination of both. Nonplanar transistors includeFinFET transistors such as double-gate transistors and tri-gatetransistors, and wrap-around or all-around gate transistors such asnanoribbon and nanowire transistors. Although the implementationsdescribed herein may illustrate only planar transistors, it should benoted that the disclosure may also be carried out using nonplanartransistors.

Each MOS transistor includes a gate stack formed of at least two layers,a gate dielectric layer and a gate electrode layer. The gate dielectriclayer may include one layer or a stack of layers. The one or more layersmay include silicon oxide, silicon dioxide (SiO₂) and/or a high-kdielectric material. The high-k dielectric material may include elementssuch as hafnium, silicon, oxygen, titanium, tantalum, lanthanum,aluminum, zirconium, barium, strontium, yttrium, lead, scandium,niobium, and zinc. Examples of high-k materials that may be used in thegate dielectric layer include, but are not limited to, hafnium oxide,hafnium silicon oxide, lanthanum oxide, lanthanum aluminum oxide,zirconium oxide, zirconium silicon oxide, tantalum oxide, titaniumoxide, barium strontium titanium oxide, barium titanium oxide, strontiumtitanium oxide, yttrium oxide, aluminum oxide, lead scandium tantalumoxide, and lead zinc niobate. In some embodiments, an annealing processmay be carried out on the gate dielectric layer to improve its qualitywhen a high-k material is used.

The gate electrode layer is formed on the gate dielectric layer and mayconsist of at least one P-type work function metal or N-type workfunction metal, depending on whether the transistor is to be a PMOS oran NMOS transistor. In some implementations, the gate electrode layermay consist of a stack of two or more metal layers, where one or moremetal layers are work function metal layers and at least one metal layeris a fill metal layer. Further metal layers may be included for otherpurposes, such as a barrier layer.

For a PMOS transistor, metals that may be used for the gate electrodeinclude, but are not limited to, ruthenium, palladium, platinum, cobalt,nickel, and conductive metal oxides, e.g., ruthenium oxide. A P-typemetal layer will enable the formation of a PMOS gate electrode with awork function that is between about 4.9 eV and about 5.2 eV. For an NMOStransistor, metals that may be used for the gate electrode include, butare not limited to, hafnium, zirconium, titanium, tantalum, aluminum,alloys of these metals, and carbides of these metals such as hafniumcarbide, zirconium carbide, titanium carbide, tantalum carbide, andaluminum carbide. An N-type metal layer will enable the formation of anNMOS gate electrode with a work function that is between about 3.9 eVand about 4.2 eV.

In some implementations, when viewed as a cross-section of thetransistor along the source-channel-drain direction, the gate electrodemay consist of a “U”-shaped structure that includes a bottom portionsubstantially parallel to the surface of the substrate and two sidewallportions that are substantially perpendicular to the top surface of thesubstrate. In another implementation, at least one of the metal layersthat form the gate electrode may simply be a planar layer that issubstantially parallel to the top surface of the substrate and does notinclude sidewall portions substantially perpendicular to the top surfaceof the substrate. In further implementations of the disclosure, the gateelectrode may consist of a combination of U-shaped structures andplanar, non-U-shaped structures. For example, the gate electrode mayconsist of one or more U-shaped metal layers formed atop one or moreplanar, non-U-shaped layers.

In some implementations of the disclosure, a pair of sidewall spacersmay be formed on opposing sides of the gate stack that bracket the gatestack. The sidewall spacers may be formed from a material such assilicon nitride, silicon oxide, silicon carbide, silicon nitride dopedwith carbon, and silicon oxynitride. Processes for forming sidewallspacers are well known in the art and generally include deposition andetching process operations. In an alternate implementation, a pluralityof spacer pairs may be used, for instance, two pairs, three pairs, orfour pairs of sidewall spacers may be formed on opposing sides of thegate stack.

As is well known in the art, source and drain regions are formed withinthe substrate adjacent to the gate stack of each MOS transistor. Thesource and drain regions are generally formed using either animplantation/diffusion process or an etching/deposition process. In theformer process, dopants such as boron, aluminum, antimony, phosphorous,or arsenic may be ion-implanted into the substrate to form the sourceand drain regions. An annealing process that activates the dopants andcauses them to diffuse further into the substrate typically follows theion implantation process. In the latter process, the substrate may firstbe etched to form recesses at the locations of the source and drainregions. An epitaxial deposition process may then be carried out to fillthe recesses with material that is used to fabricate the source anddrain regions. In some implementations, the source and drain regions maybe fabricated using a silicon alloy such as silicon germanium or siliconcarbide. In some implementations the epitaxially deposited silicon alloymay be doped in situ with dopants such as boron, arsenic, orphosphorous. In further embodiments, the source and drain regions may beformed using one or more alternate semiconductor materials such asgermanium or a group III-V material or alloy. And in furtherembodiments, one or more layers of metal and/or metal alloys may be usedto form the source and drain regions.

One or more interlayer dielectrics (ILD) are deposited over the MOStransistors. The ILD layers may be formed using dielectric materialsknown for their applicability in integrated circuit structures, such aslow-k dielectric materials. Examples of dielectric materials that may beused include, but are not limited to, silicon dioxide (SiO₂), carbondoped oxide (CDO), silicon nitride, organic polymers such asperfluorocyclobutane or polytetrafluoroethylene, fluorosilicate glass(FSG), and organosilicates such as silsesquioxane, siloxane, ororganosilicate glass. The ILD layers may include pores or air gaps tofurther reduce their dielectric constant.

FIG. 1 schematically illustrates a memory array 100 with multiple memorycells (e.g., a memory cell 102, a memory cell 104, a memory cell 106,and a memory cell 108), where a TFT, e.g., a TFT 114, may be a selectorof a memory cell, e.g., the memory cell 102, in accordance with variousembodiments.

In embodiments, the multiple memory cells may be arranged in a number ofrows and columns coupled by bit lines, e.g., bit line B1 and bit lineB2, word lines, e.g., word line W1 and word line W2, and source lines,e.g., source line S1 and source line S2. The memory cell 102 may becoupled in series with the other memory cells of the same row, and maybe coupled in parallel with the memory cells of the other rows. Thememory array 100 may include any suitable number of one or more memorycells. Although the memory array 100 is shown in FIG. 1 with two rowsthat each includes two memory cells coupled in series, other embodimentsmay include other numbers of rows and/or numbers of memory cells withina row. In some embodiments, the number of rows may be different from thenumber of columns in a memory array. Each row of the memory array mayhave a same number of memory cells. Additionally, or alternatively,different rows may have different numbers of memory cells.

In embodiments, multiple memory cells, such as the memory cell 102, thememory cell 104, the memory cell 106, and the memory cell 108, may havea similar configuration, such as the 1T1C configuration. For example,the memory cell 102 may include the TFT 114 coupled to a storage cell112 that may be a capacitor. A memory cell with the 1T1C configuration,e.g., the memory cell 102, may be controlled through multiple electricalconnections to read from the memory cells, write to the memory cells,and/or perform other memory operations. In some embodiments, the storagecell 112 may be another type of storage device, e.g., a resistive randomaccess memory (RRAM) cell.

In embodiments, when the storage cell 112 is a capacitor, the storagecell 112 may be switchable between charged or discharged states uponapplication of an electric current or voltage. The charged or dischargedstates of the storage cell 112 may be taken to represent the two valuesof a bit, conventionally called 0 and 1. The storage cell 112 may beindividually controllable by the TFT 114 as a selector to switch betweenthe charged or discharged states.

The TFT 114 may be a selector for the memory cell 102. A word line W1 ofthe memory array 100 may be coupled to a gate electrode 111 of the TFT114. When the word line W1 is active, the TFT 114 may select the storagecell 112. A source line S1 of the memory array 100 may be coupled to anelectrode 101 of the storage cell 112, while another electrode 107 ofthe storage cell 112 may be shared with the TFT 114. In addition, a bitline B1 of the memory array 100 may be coupled to another electrode,e.g., an electrode 109 of the TFT 114. The shared electrode 107 may be asource electrode or a drain electrode of the TFT 114, while theelectrode 109 may be a drain electrode or a source electrode of the TFT114. A drain electrode and a source electrode may be usedinterchangeably herein. Additionally, a source line and a bit line maybe used interchangeably herein.

In various embodiments, the memory cells and the transistors, e.g., thememory cell 102 and the TFT 114, included in the memory array 100 may beformed in back-end-of-line (BEOL). For example, the TFT 114 may beillustrated as a TFT 714 shown in FIG. 7 at the BEOL. Accordingly, thememory array 100 may be formed in higher metal layers, e.g., metal layer3 and/or metal layer 4, of the integrated circuit above the activesubstrate region, and may not occupy the active substrate area that isoccupied by conventional transistors or memory devices.

FIG. 2 schematically illustrates a diagram of a TFT, e.g., a TFT 214,having a gate electrode, e.g., a gate electrode 222, with a gate lengthdetermined by a spacer, e.g., a spacer 224, in accordance with someembodiments. The TFT 214 may be an example of the TFT 114 in FIG. 1. Thestructure of the TFT 214 may be for illustration purpose only and is notlimiting. The TFT 214 may have other configurations including more orfewer layers than are shown in FIG. 2.

In embodiments, the TFT 214 may include a substrate 220, a dielectriclayer 221 above the substrate 220, a gate electrode 222 above thedielectric layer 221, a gate dielectric layer 223 conformally coveringthe gate electrode 222 and the substrate 220, another dielectric layer225 above the gate dielectric layer 223, and a channel layer 227 aboveanother dielectric layer 225. In addition, the TFT 214 may include asource electrode 226, a drain electrode 228, and the spacer 224 abovethe channel layer 227, where the drain electrode 228 may be separatedfrom the source electrode 226 by the spacer 224. In embodiments, thespacer 224 may overlap with the gate electrode 222. Furthermore, a topdielectric layer 229 may be above the source electrode 226, the drainelectrode 228, and the spacer 224.

In embodiments, the substrate 220 may be a glass substrate, such as sodalime glass or borosilicate glass, a metal substrate, a plasticsubstrate, or another suitable substrate. Other inter-metal dielectriclayer may be formed on the substrate. The substrate 220 may include aninter-metal dielectric layer, or other devices, not shown for clarity.

In embodiments, the dielectric layer 221, another dielectric layer 225,or the top dielectric layer 229, may be optional. The dielectric layer221, another dielectric layer 225, or the top dielectric layer 229 mayinclude a silicon oxide (SiO) film, a silicon nitride (SiN) film,O₃-tetraethylorthosilicate (TEOS), O₃-hexamethyldisiloxane (HMDS),plasma-TEOS oxide layer, or other suitable materials.

In embodiments, the gate electrode 222 may be formed as a single layeror a stacked layer using one or more conductive films including aconductive material. For example, the gate electrode 222 may includegold (Au), platinum (Pt), ruthenium (Ru), iridium (Ir), titanium (Ti),aluminum (Al), copper (Cu), tantalum (Ta), tungsten (W), tantalumnitride (TaN), titanium nitride (TiN), iridium-tantalum alloy (Ir—Ta),indium-tin oxide (ITO), the like, and/or a combination thereof.

In embodiments, the gate dielectric layer 223 may include silicon andoxygen, silicon and nitrogen, yttrium and oxygen, silicon, oxygen, andnitrogen, aluminum and oxygen, hafnium and oxygen, tantalum and oxygen,or titanium and oxygen. For example, the gate dielectric layer 223 mayinclude silicon oxide (SiO₂), silicon nitride (SiN_(x)), yttrium oxide(Y₂O₃), silicon oxynitride (SiO_(x)N_(y)), aluminum oxide (Al₂O₃),hafnium(IV) oxide (HfO₂), tantalum oxide (Ta₂O₅), titanium dioxide(TiO₂), or other materials.

In embodiments, the channel layer 227 may include a material comprisingamorphous silicon, zinc (Zn), or oxygen (O), such as, indium galliumzinc oxide (IGZO), amorphous InGaZnO (a-IGZO), crystal-like InGaZnO(c-IGZO), GaZnON, ZnON, or C-Axis Aligned Crystal (CAAC). The channellayer 227 may have a thickness in a range of about 10 nm to about 100nm.

In embodiments, the source electrode 226 and the drain electrode 228 mayinclude one or more conductive films including a conductive material.For example, the source electrode 226 and the drain electrode 228 mayinclude Ti, molybdenum (Mo), Au, Pt, Al, nickel (Ni), Cu, chromium (Cr),Ru, iridium (Ir), Ta, W, an alloy of Ti, Mo, Au, Pt, Al, Ni, Cu, Cr, Ru,Ir, Ta, W. or another suitable material. The source electrode 226 andthe drain electrode 228 may be patterned at a different time, and mayhave different width. For example, the source electrode 226 may have afirst width L1, and the drain electrode 228 may have a second width L2different from the first width. Additionally and alternatively, thesource electrode 226 may include a first conductive material, and thedrain electrode 228 may include a second conductive material differentfrom the first conductive material.

In embodiments, the spacer 224 may separate the source electrode 226 andthe drain electrode 228. The spacer 224 may include a first dielectricmaterial, and the top dielectric layer 229 may include a seconddielectric material different from the first dielectric material. Thespacer 224 may have a width L3 that is about 5% to 15% of the width L1of the source electrode 226. In embodiments, the spacer 224 may overlapwith the gate electrode 222, (e.g., such that it is possible to draw astraight vertical line, e.g., a vertical line 211 or a vertical line 213that is orthogonal to a plane of the substrate 220, connecting one pointwithin the first component to another point within the secondcomponent). In some embodiments, the spacer 224 may fully overlap withthe gate electrode 222 (with all portions of the spacer 224 locatedvertically above or below the gate electrode 222), as shown in FIG. 2.In addition, the gate electrode 222 may partially overlap with thesource electrode 226 and the drain electrode 228. In some otherembodiments, the spacer 224 may partially overlap with the gateelectrode 222.

As shown in FIG. 2, a gate length, Lg, of the gate electrode 222 may bedetermined by the spacer 224, where the gate length may be a same as thewidth of the spacer 224, e.g., Lg=L3. On the other hand, the gateelectrode 222 may have a physical length L4, which may be a same orslightly larger than the width of the spacer 224. In some embodiments,the physical length L4 may be 10% larger than the width L3 of the spacer224.

FIG. 3 schematically illustrates a diagram of two TFTs, e.g., a TFT 314and a TFT 304, where a source electrode of a TFT may be separated from asource electrode of an adjacent TFT by a pitch, in accordance with someembodiments. The TFT 314 or the TFT 304 may be an example of the TFT 114in FIG. 1, or the TFT 214 in FIG. 2.

In embodiments, the TFT 314 may include a substrate 320, a dielectriclayer 321 above the substrate 320, a gate electrode 322 above thedielectric layer 321, a gate dielectric layer 323 conformally coveringthe gate electrode 322 and the substrate 320, another dielectric layer325 above the gate dielectric layer 323, and a channel layer 327 aboveanother dielectric layer 325. In addition, the TFT 314 may include asource electrode 326, a drain electrode 328, and a spacer 324 above thechannel layer 327, where the drain electrode 328 is separated from thesource electrode 326 by the spacer 324. In embodiments, the spacer 324may overlap (e.g., fully overlap) with the gate electrode 322.

In embodiments, similarly, the TFT 304 may include the substrate 320,and the dielectric layer 321 above the substrate 320, which are sharedwith the TFT 314. A gate electrode 332 may be above the dielectric layer321. The gate dielectric layer 323 may be shared with the TFT 314 andmay conformally cover the gate electrode 332 and the substrate 320. TheTFT 304 may further share with the TFT 314 another dielectric layer 325above the gate dielectric layer 323, and the channel layer 327 above theanother dielectric layer 325. In addition, the TFT 304 may include asource electrode 336, a drain electrode 338, and a spacer 334 above thechannel layer 327, wherein the drain electrode 338 is separated from thesource electrode 336 by the spacer 334. In embodiments, the spacer 334may overlap (e.g., fully overlap) with the gate electrode 332.

In embodiments, the TFT 314 and the TFT 304 may be adjacent to eachother and separated by a spacer 344 and an isolation gate 342. Theisolation gate 342 may be an isolated electrode that is not coupled toany conductive lines (e.g., to receive a control signal). The distancebetween the source electrode 326 and the source electrode 336 may be apitch P, which is determined by the lithography technology used topattern and fabricate the TFT 314 and the TFT 304. In addition, thesource electrode 326 may have a first width L1, the drain electrode 328may have a second width L2, and the spacer 324 may have a third widthL3, where the sum of L2 and L3 may be equal to the pitch P. In addition,the spacer 324 may overlap (e.g., fully overlap) with the gate electrode322, and the gate electrode 322 may have a gate length Lg=L3. Therefore,the gate length Lg may be shorter than the pitch P, with fewervariations. As a result, the TFTs may have reduced on and off currentchange, resulting in improved performance and retention time of a memorycell where the TFT 314 may be used as a selector. At the meantime, thegate electrode 322 may have a physical length L4 at least the same orlarger than Lg. For example, the physical length L4 may be within arange of [L3, 1.1*L3], compared to the width of the spacer 322.

FIG. 4 illustrates a process 400 for forming a TFT having a gateelectrode with a gate length determined by a spacer, in accordance withsome embodiments. In embodiments, the process 400 may be applied to formthe TFT 114 in FIG. 1, the TFT 214 in FIG. 2, the TFT 314, or the TFT304 in FIG. 3.

At block 401, the process 400 may include forming a gate electrode abovea substrate. For example, the process 400 may include forming the gateelectrode 222 above the substrate 220 as shown in FIG. 2.

At block 403, the process 400 may include forming a gate dielectriclayer conformally covering the gate electrode and the substrate. Forexample, the process 400 may include forming the gate dielectric layer223 conformally covering the gate electrode 222 and the substrate 220,as shown in FIG. 2. In embodiments, the gate dielectric layer, e.g., thegate dielectric layer 223, may include silicon and oxygen, silicon andnitrogen, yttrium and oxygen, silicon, oxygen, and nitrogen, aluminumand oxygen, hafnium and oxygen, tantalum and oxygen, or titanium andoxygen.

At block 405, the process 400 may include forming a channel layer abovethe gate dielectric layer. For example, the process 400 may includeforming the channel layer 227 above the gate dielectric layer 223, asshown in FIG. 2. In embodiments, the channel layer, e.g., the channellayer 227, may include amorphous silicon, zinc (Zn), or oxygen (O).

At block 407, the process 400 may include forming a source electrodeabove the channel layer. For example, the process 400 may includeforming the source electrode 226 above the channel layer 227, as shownin FIG. 2. As another example, the process 400 may include forming thesource electrode 326 above the channel layer 327, as shown in FIG. 3. Inembodiments, the source electrode, e.g., the source electrode 326, maybe separated from another source electrode of an adjacent transistor,e.g., the source electrode 336 of the TFT 304, by a pitch, as shown inFIG. 3.

At block 409, the process 400 may include forming a spacer next to thesource electrode and above the channel layer. For example, the process400) may include forming the spacer 224 next to the source electrode 226and above the channel layer 227, as shown in FIG. 2. In embodiments, thespacer 224 may have a width smaller than a width of the source electrode226. For example, the spacer 224 may have a width that is about 5% to15% of the width of the source electrode 226. Furthermore, the spacer,e.g., the spacer 224, may overlap (e.g., fully overlap) with the gateelectrode, e.g., the gate electrode 222.

At block 411, the process 400 may include forming a drain electrode nextto the spacer and above the channel layer. For example, the process 400may include forming the drain electrode 228 next to the spacer 224 andabove the channel layer 227. As another example, the process 400 mayinclude forming the drain electrode 328 next to the spacer 324 and abovethe channel layer 327, as shown in FIG. 3. In embodiments, a sum of awidth of the drain electrode 328, a width of the source electrode 326,and a width of the spacer 324 may be less than the pitch P, as shown inFIG. 3.

In embodiments, the source electrode and the drain electrode, e.g., thesource electrode 226 and the drain electrode 228 may be formed atdifferent times, and hence with different materials and widths. Forexample, the source electrode 226 may include a first conductivematerial, and the drain electrode 228 may include a second conductivematerial different from the first conductive material. Similarly, thesource electrode 226 may have a first width, and the drain electrode 228may have a second width different from the first width. In some otherembodiments, the source electrode 226 and the drain electrode 228 mayhave a same width or include a same material. The source electrode orthe drain electrode may include Au, Pt, Ru, Ir, Ti, Al, Cu. Ta, tungsten(W), iridium-tantalum alloy (Ir—Ta), or indium-tin oxide (ITO).

In addition, the process 400 may include additional operations. Forexample, the process 400 may include forming a top dielectric layerabove the source electrode, the drain electrode, and the spacer. Inembodiments, the spacer may include a first dielectric material, and thetop dielectric layer may include a second dielectric material differentfrom the first dielectric material. Furthermore, the process 400 mayinclude forming a second source electrode above the channel layer, wherethe second source electrode may be separated from the first sourceelectrode by the pitch, and forming a second spacer between the drainelectrode and the second source electrode and above the channel layer.

FIG. 5 illustrates an interposer 500 that includes one or moreembodiments of the disclosure. The interposer 500 is an interveningsubstrate used to bridge a first substrate 502 to a second substrate504. The first substrate 502 may be, for instance, a substrate supportfor a TFT, e.g., the TFT 114 shown in FIG. 1 or the TFT 214 shown inFIG. 2. The second substrate 504 may be, for instance, a memory module,a computer motherboard, or another integrated circuit die. For example,the second substrate 504 may be a memory module including the memoryarray 100 as shown in FIG. 1. Generally, the purpose of an interposer500 is to spread a connection to a wider pitch or to reroute aconnection to a different connection. For example, an interposer 500 maycouple an integrated circuit die to a ball grid array (BGA) 506 that cansubsequently be coupled to the second substrate 504. In someembodiments, the first and second substrates 502/504 are attached toopposing sides of the interposer 500. In other embodiments, the firstand second substrates 502/504 are attached to the same side of theinterposer 500. And in further embodiments, three or more substrates areinterconnected by way of the interposer 500.

The interposer 500 may be formed of an epoxy resin, afiberglass-reinforced epoxy resin, a ceramic material, or a polymermaterial such as polyimide. In further implementations, the interposermay be formed of alternate rigid or flexible materials that may includethe same materials described above for use in a semiconductor substrate,such as silicon, germanium, and other group III-V and group IVmaterials.

The interposer may include metal interconnects 508 and vias 510,including but not limited to through-silicon vias (TSVs) 512. Theinterposer 500 may further include embedded devices 514, including bothpassive and active devices. Such devices include, but are not limitedto, capacitors, decoupling capacitors, resistors, inductors, fuses,diodes, transformers, sensors, and electrostatic discharge (ESD)devices. More complex devices such as radio-frequency (RF) devices,power amplifiers, power management devices, antennas, arrays, sensors,and MEMS devices may also be formed on the interposer 500.

In accordance with embodiments of the disclosure, apparatuses orprocesses disclosed herein may be used in the fabrication of interposer500.

FIG. 6 illustrates a computing device 600 in accordance with oneembodiment of the disclosure. The computing device 600 may include anumber of components. In one embodiment, these components are attachedto one or more motherboards. In an alternate embodiment, some or all ofthese components are fabricated onto a single system-on-a-chip (SoC)die, such as a SoC used for mobile devices. The components in thecomputing device 600 include, but are not limited to, an integratedcircuit die 602 and at least one communications logic unit 608. In someimplementations the communications logic unit 608 is fabricated withinthe integrated circuit die 602 while in other implementations thecommunications logic unit 608 is fabricated in a separate integratedcircuit chip that may be bonded to a substrate or motherboard that isshared with or electronically coupled to the integrated circuit die 602.The integrated circuit die 602 may include a processor 604 as well ason-die memory 606, often used as cache memory, which can be provided bytechnologies such as embedded DRAM (eDRAM), or SRAM. For example, theon-die memory 606 may include the TFT 114 shown in FIG. 1, the TFT 214shown in FIG. 2, the TFT 314 or the TFT 304 shown in FIG. 3, or a TFTformed according to the process 400 shown in FIG. 4.

In embodiments, the computing device 600 may include a display or atouchscreen display 624, and a touchscreen display controller 626. Adisplay or the touchscreen display 624 may include a FPD, an AMOLEDdisplay, a TFT LCD, a micro light-emitting diode (μLED) display, orothers. For example, the touchscreen display 624 may include the TFT 114shown in FIG. 1, the TFT 214 shown in FIG. 2, the TFT 314 or the TFT 304shown in FIG. 3, or a TFT formed according to the process 400 shown inFIG. 4.

Computing device 600 may include other components that may or may not bephysically and electrically coupled to the motherboard or fabricatedwithin a SoC die.

These other components include, but are not limited to, volatile memory610 (e.g., dynamic random access memory (DRAM), non-volatile memory 612(e.g., ROM or flash memory), a graphics processing unit 614 (GPU), adigital signal processor (DSP) 616, a crypto processor 642 (e.g., aspecialized processor that executes cryptographic algorithms withinhardware), a chipset 620, at least one antenna 622 (in someimplementations two or more antenna may be used), a battery 630 or otherpower source, a power amplifier (not shown), a voltage regulator (notshown), a global positioning system (GPS) device 628, a compass, amotion coprocessor or sensors 632 (that may include an accelerometer, agyroscope, and a compass), a microphone (not shown), a speaker 634, acamera 636, user input devices 638 (such as a keyboard, mouse, stylus,and touchpad), and a mass storage device 640 (such as hard disk drive,compact disk (CD), digital versatile disk (DVD), and so forth). Thecomputing device 600 may incorporate further transmission,telecommunication, or radio functionality not already described herein.In some implementations, the computing device 600 includes a radio thatis used to communicate over a distance by modulating and radiatingelectromagnetic waves in air or space. In further implementations, thecomputing device 600 includes a transmitter and a receiver (or atransceiver) that is used to communicate over a distance by modulatingand radiating electromagnetic waves in air or space.

The communications logic unit 608 enables wireless communications forthe transfer of data to and from the computing device 600. The term“wireless” and its derivatives may be used to describe circuits,devices, systems, methods, techniques, communications channels, etc.,that may communicate data through the use of modulated electromagneticradiation through a non-solid medium. The term does not imply that theassociated devices do not contain any wires, although in someembodiments they might not. The communications logic unit 608 mayimplement any of a number of wireless standards or protocols, includingbut not limited to Wi-Fi (IEEE 802.11 family), WiMAX (IEEE 802.16family), IEEE 802.20, long term evolution (LTE), Ev-DO, HSPA+, HSDPA+,HSUPA+, EDGE, GSM, GPRS, CDMA, TDMA, DECT, Infrared (IR), Near FieldCommunication (NFC), Bluetooth, derivatives thereof, as well as anyother wireless protocols that are designated as 3G, 4G, 5G, and beyond.The computing device 600 may include a plurality of communications logicunits 608. For instance, a first communications logic unit 608 may bededicated to shorter range wireless communications such as Wi-Fi, NFC.and Bluetooth and a second communications logic unit 608 may bededicated to longer range wireless communications such as GPS, EDGE,GPRS, CDMA, WiMAX, LTE, Ev-DO, and others.

The processor 604 of the computing device 600 includes one or moredevices, such as transistors. The term “processor” may refer to anydevice or portion of a device that processes electronic data fromregisters and/or memory to transform that electronic data into otherelectronic data that may be stored in registers and/or memory. Thecommunications logic unit 608 may also include one or more devices, suchas transistors.

In further embodiments, another component housed within the computingdevice 600 may contain one or more devices, such as DRAM, that areformed in accordance with implementations of the current disclosure,e.g., the memory array 100 shown in FIG. 1, the TFT 114 shown in FIG. 1,the TFT 214 shown in FIG. 2, the TFT 314 or the TFT 304 shown in FIG. 3,or a TFT formed according to the process 400 shown in FIG. 4.

In various embodiments, the computing device 600 may be a laptopcomputer, a netbook computer, a notebook computer, an ultrabookcomputer, a smartphone, a dumbphone, a tablet, a tablet/laptop hybrid, apersonal digital assistant (PDA), an ultra mobile PC, a mobile phone, adesktop computer, a server, a printer, a scanner, a monitor, a set-topbox, an entertainment control unit, a digital camera, a portable musicplayer, or a digital video recorder. In further implementations, thecomputing device 600 may be any other electronic device that processesdata.

FIG. 7 schematically illustrates a diagram of the TFT 714 having a gateelectrode 722 with a gate length determined by a spacer 724 and formedin back-end-of-line (BEOL) on a substrate 720, in accordance with someembodiments. The TFT 714 may be an example of the TFT 114 in FIG. 1, anexample of the TFT 214 in FIG. 2, or an example of the TFT 314 in FIG.3. Various layers in the TFT 714 may be similar to corresponding layersin the TFT 214 in FIG. 2, or the TFT 314 in FIG. 3. The structure of theTFT 714 may be for illustration purpose only and is not limiting.

In embodiments, the TFT 714 may be formed on the substrate 720, and mayinclude a dielectric layer 721 above the substrate 720, the gateelectrode 722 above the dielectric layer 721, a gate dielectric layer723 conformally covering the gate electrode 722 and the substrate 720,another dielectric layer 725 above the gate dielectric layer 723, and achannel layer 727 above another dielectric layer 725. In embodiments,another dielectric layer 725 may be similar to another dielectric layer225 shown in FIG. 2, while the channel layer 727 may be similar to thechannel layer 227 shown in FIG. 2. In addition, the TFT 714 may includea source electrode 726, a drain electrode 728, and the spacer 724 abovethe channel layer 727, where the drain electrode 728 may be separatedfrom the source electrode 726 by the spacer 724. In embodiments, thespacer 724 may overlap with the gate electrode 722. In embodiments,there may be other layers. e.g., a top dielectric layer above the sourceelectrode 726, the drain electrode 728, and the spacer 724, not shown.

In embodiments, the TFT 714 may be formed at the BEOL 740. In additionto the TFT 714, the BEOL 740 may further include a dielectric layer 710,where one or more vias, e.g., a via 718, may be connected to one or moreinterconnect, e.g., an interconnect 716, and an interconnect 712 withinthe dielectric layer 710. In embodiments, the interconnect 716 and theinterconnect 712 may be of different metal layers at the BEOL 740. Thedielectric layer 710 is shown for example only. Although not shown byFIG. 7, in various embodiments there may be multiple dielectric layersincluded in the BEOL 740.

In embodiments, the BEOL 740 may be formed on the front-end-of-line(FEOL) 730. The FEOL 730 may include the substrate 720. In addition, theFEOL 730 may include other devices, e.g., a transistor 734. Inembodiments, the transistor 734 may be a FEOL transistor, including asource 711, a drain 713, and a gate 715, with a channel 717 between thesource 711 and the drain 713 under the gate 715. Furthermore, thetransistor 734 may be coupled to interconnects, e.g., the interconnect712, through a via 719.

The above description of illustrated implementations of the disclosure,including what is described in the Abstract, is not intended to beexhaustive or to limit the disclosure to the precise forms disclosed.While specific implementations of, and examples for, the disclosure aredescribed herein for illustrative purposes, various equivalentmodifications are possible within the scope of the disclosure, as thoseskilled in the relevant art will recognize.

Some Non-Limiting Examples are Provided Below

Example 1 may include a TFT, comprising: a gate electrode above asubstrate; a channel layer above the gate electrode; and a sourceelectrode, a drain electrode, and a spacer, wherein the sourceelectrode, the drain electrode, and the spacer are above the channellayer, the drain electrode is separated from the source electrode by thespacer, the spacer overlaps with the gate electrode, the sourceelectrode has a first width, and the drain electrode has a second widthdifferent from the first width.

Example 2 may include the TFT of example 1 and/or some other examplesherein, wherein the spacer has a third width that is about 5% to 15% ofthe first width.

Example 3 may include the TFT of example 1 and/or some other examplesherein, wherein the source electrode includes a first conductivematerial, and the drain electrode includes a second conductive materialdifferent from the first conductive material.

Example 4 may include the TFT of example 1 and/or some other examplesherein, further comprising: a top dielectric layer above the sourceelectrode, the drain electrode, and the spacer, wherein the spacerincludes a first dielectric material, and the top 5 dielectric layerincludes a second dielectric material different from the firstdielectric material.

Example 5 may include the TFT of example 1 and/or some other examplesherein, further comprising: a gate dielectric layer above the gateelectrode and below the channel layer, wherein the gate dielectric layerincludes silicon and oxygen, silicon and nitrogen, yttrium and oxygen,silicon, oxygen, and nitrogen, aluminum and oxygen, hafnium and oxygen,tantalum and oxygen, or titanium and oxygen.

Example 6 may include the TFT of any one of examples 1-5 and/or someother examples herein, wherein the source electrode is a first sourceelectrode, the spacer is a first spacer, and the TFT further comprises:a second source electrode above the channel layer, wherein the secondsource electrode is separated from the first source electrode by apitch; and a second spacer between the drain electrode and the secondsource electrode.

Example 7 may include the TFT of any one of examples 1-5 and/or someother examples herein, wherein the channel layer includes amorphoussilicon, zinc (Zn), or oxygen (O).

Example 8 may include the TFT of any one of examples 1-5 and/or someother examples herein, wherein the TFT is above an interconnect, and theinterconnect is above the substrate.

Example 9 may include a method for forming a TFT, the method comprising:forming a gate electrode above a substrate; forming a gate dielectriclayer conformally covering the gate electrode and the substrate; forminga channel layer above the gate dielectric layer; forming a sourceelectrode above the channel layer, wherein the source electrode isseparated from another source electrode of an adjacent transistor by apitch, and the source electrode has a first width; forming a spacer nextto the source electrode and above the channel layer, wherein the spacerhas a second width, and overlaps with the gate electrode; and forming adrain electrode next to the spacer and above the channel layer, whereinthe drain electrode has a third width, and the sum of the first width,the second width, and the third width is less than the pitch.

Example 10 may include the method of example 9 and/or some otherexamples herein, wherein the source electrode is a first sourceelectrode, the spacer is a first spacer, and the method furthercomprising: forming a second source electrode above the channel layer,wherein the second source electrode is separated from the first sourceelectrode by the pitch; and forming a second spacer between the drainelectrode and the second source electrode and above the channel layer.

Example 11 may include the method of example 9 and/or some otherexamples herein, wherein the second width is about 5% to 15% of thefirst width.

Example 12 may include the method of example 9 and/or some otherexamples herein, where the source electrode includes a first conductivematerial, and the drain electrode includes a second conductive materialdifferent from the first conductive material.

Example 13 may include the method of example 9 and/or some otherexamples herein, where the first width is different from the thirdwidth.

Example 14 may include the method of any one of examples 9-13 and/orsome other examples herein, further comprising: forming a top dielectriclayer above the source electrode, the drain electrode, and the spacer,wherein the spacer includes a first dielectric material, and the topdielectric layer includes a second dielectric material different fromthe first dielectric material.

Example 15 may include the method of any one of examples 9-13 and/orsome other examples herein, wherein the gate dielectric layer includessilicon and oxygen, silicon and nitrogen, yttrium and oxygen, silicon,oxygen, and nitrogen, aluminum and oxygen, hafnium and oxygen, tantalumand oxygen, or titanium and oxygen.

Example 16 may include the method of any one of examples 9-13 and/orsome other examples herein, wherein the channel layer includes amorphoussilicon, zinc (Zn), or oxygen (O).

Example 17 may include the method of any one of examples 9-13 and/orsome other examples herein, wherein the source electrode or the drainelectrode includes gold (Au), platinum (Pt), ruthenium (Ru), iridium(Ir), titanium (Ti), aluminum (Al), copper (Cu), tantalum (Ta), tungsten(W), iridium-tantalum alloy (Ir—Ta), or indium-tin oxide (ITO).

Example 18 may include a computing device, comprising: a circuit board;and a memory device coupled to the circuit board and including a memoryarray, wherein the memory array includes a plurality of memory cells, amemory cell of the plurality of memory cells includes a transistor and astorage cell, and wherein the transistor includes: a gate electrodecoupled to a word line of the memory array; a channel layer above thegate electrode, and a source electrode, a drain electrode, and a spacer,wherein the source electrode, the drain electrode, and the spacer areabove the channel layer, the source electrode is coupled to a sourceline of the memory array, the drain electrode is coupled to the storagecell, the drain electrode is separated from the source electrode by thespacer, the spacer overlaps with the gate electrode, the sourceelectrode has a first width, and the drain electrode has a second widthdifferent from the first width; and the storage cell is coupled to a bitline of the memory array.

Example 19 may include the computing device of example 18 and/or someother examples herein, wherein the spacer has a third width that isabout 5% to 15% of the first width.

Example 20 may include the computing device of example 18 and/or someother examples herein, wherein the source electrode includes a firstconductive material, and the drain electrode includes a secondconductive material different from the first conductive material.

Example 21 may include the computing device of any one of examples 18-20and/or some other examples herein, wherein the transistor furtherincludes: a top dielectric layer above the source electrode, the drainelectrode, and the spacer, wherein the spacer includes a firstdielectric material, and the top dielectric layer includes a seconddielectric material different from the first dielectric material.

Example 22 may include the computing device of any one of examples 18-20and/or some other examples herein, wherein the transistor furtherincludes: a gate dielectric layer above the gate electrode and below thechannel layer; wherein the gate dielectric layer includes silicon andoxygen, silicon and nitrogen, yttrium and oxygen, silicon, oxygen, andnitrogen, aluminum and oxygen, hafnium and oxygen, tantalum and oxygen,or titanium and oxygen.

Example 23 may include the computing device of any one of examples 18-20and/or some other examples herein, wherein the channel layer includesamorphous silicon, zinc (Zn), or oxygen (O).

Example 24 may include the computing device of any one of examples 18-20and/or some other examples herein, wherein the transistor is above aninterconnect, and the interconnect is above a substrate.

Example 25 may include the computing device of any one of examples 18-20and/or some other examples herein, wherein the memory cell is a firstmemory cell, the storage cell is a first storage cell, the transistor isa first transistor, the source electrode is a first source electrode,the spacer is a first spacer, the plurality of memory cells furtherincludes a second memory cell, and the second memory cell includes asecond transistor including: a second source electrode above the channellayer, wherein the second source electrode is separated from the firstsource electrode by a pitch, and the second source electrode is coupledto the source line of the memory array; and a second spacer between thedrain electrode and the second source electrode.

Various embodiments may include any suitable combination of theabove-described embodiments including alternative (or) embodiments ofembodiments that are described in conjunctive form (and) above (e.g.,the “and” may be “and/or”). Furthermore, some embodiments may includeone or more articles of manufacture (e.g., non-transitorycomputer-readable media) having instructions, stored thereon, that whenexecuted result in actions of any of the above-described embodiments.Moreover, some embodiments may include apparatuses or systems having anysuitable means for carrying out the various operations of theabove-described embodiments.

The above description of illustrated implementations, including what isdescribed in the Abstract, is not intended to be exhaustive or to limitthe embodiments of the present disclosure to the precise formsdisclosed. While specific implementations and examples are describedherein for illustrative purposes, various equivalent modifications arepossible within the scope of the present disclosure, as those skilled inthe relevant art will recognize.

These modifications may be made to embodiments of the present disclosurein light of the above detailed description. The terms used in thefollowing claims should not be construed to limit various embodiments ofthe present disclosure to the specific implementations disclosed in thespecification and the claims. Rather, the scope is to be determinedentirely by the following claims, which are to be construed inaccordance with established doctrines of claim interpretation.

What is claimed is:
 1. An integrated circuit (IC) comprising: a firstthin film transistor (TFT) that includes: a first gate electrode withina gate dielectric layer above a substrate; a channel layer above thefirst gate electrode; a first source electrode, a first drain electrode,and a first spacer, wherein the first source electrode, the first drainelectrode, and the first spacer are above the channel layer, the firstdrain electrode is separated from the first source electrode by thefirst spacer, the first spacer overlaps with the first gate electrode,wherein a width of the first spacer between the first source electrodeand the first drain electrode is substantially equal to a width of thefirst gate electrode, the first source electrode has a first width, andthe drain electrode has a second width different from the first width; asecond TFT coupled to the first TFT, the second TFT includes: a secondgate electrode within the gate dielectric layer above the substrate, thechannel layer above the second gate electrode; a second sourceelectrode, a second drain electrode, and a second spacer, wherein thesecond source electrode, the second drain electrode, and the secondspacer are above the channel layer, wherein the second source electrodeis separated from the first source electrode by a pitch along ahorizontal plane; the second spacer positioned between the first drainelectrode and the second source electrode and overlapping the secondgate electrode; and an isolation gate within the gate dielectric layerbetween the first gate electrode and the second gate electrode, whereina third spacer between the first drain electrode and the second sourceelectrode overlaps with the isolation gate.
 2. The IC of claim 1,wherein the second spacer has a width that is about 5% to 15% of a widthof the second gate electrode.
 3. The IC of claim 1, wherein the firstsource electrode includes a first conductive material, and the firstdrain electrode includes a second conductive material different from thefirst conductive material.
 4. The IC of claim 1, further comprising: atop dielectric layer above the first source electrode, the first drainelectrode, and the first spacer, wherein the first spacer includes afirst dielectric material, and the top dielectric layer includes asecond dielectric material different from the first dielectric material.5. The IC of claim 1, further comprising: a gate dielectric layer abovethe gate electrode and below the channel layer, wherein the gatedielectric layer includes silicon and oxygen, silicon and nitrogen,yttrium and oxygen, silicon, oxygen, and nitrogen, aluminum and oxygen,hafnium and oxygen, tantalum and oxygen, or titanium and oxygen.
 6. TheIC of claim 1, wherein the channel layer includes amorphous silicon,zinc (Zn), or oxygen (O).
 7. The IC of claim 1, wherein the TFT is abovean interconnect, and the interconnect is above the substrate.
 8. Acomputing device, comprising: a circuit board; and a memory devicecoupled to the circuit board and including a memory array, wherein thememory array includes a plurality of memory cells, a memory cell of theplurality of memory cells includes an integrated circuit (IC) and astorage cell, and wherein the IC includes: a first thin film transistor(TFT) that includes: a first gate electrode coupled to a first word lineof the memory array; a channel layer above the first gate electrode; afirst source electrode, a first drain electrode, and a first spacer,wherein the first source electrode, the first drain electrode, and thefirst spacer are above the channel layer, the first source electrode iscoupled to a first source line of the memory array, the first drainelectrode is coupled to the storage cell, the first drain electrode isseparated from the first source electrode by the first spacer, the firstspacer overlaps with the first gate electrode, wherein a width of thefirst spacer between the first source electrode and the first drainelectrode is greater than or equal to a width of die first gateelectrode, the first source electrode has a first width, and the firstdrain electrode has a second width different from the first width; asecond TFT coupled to the first TFT, the second TFT includes: a secondgate electrode coupled to a second word line of the memory array; asecond source electrode, a second drain electrode, and a second spacer,wherein the second source electrode, the second drain electrode, and thesecond spacer are above the channel layer, wherein the second sourceelectrode is separated from the first source electrode by a pitch alonga horizontal plane; the second spacer positioned between the first drainelectrode and the second source electrode; and an isolation gate withina gate dielectric layer between the first gate electrode and the secondgate electrode, wherein a third spacer between the first drain electrodeand the second source electrode overlaps with the isolation gate; andwherein the storage cell is coupled to a bit line of the memory array.9. The computing device of claim 8, wherein the second first spacer hasa width that is about 5% to 15% of a width of the second sate electrode.10. The computing device of claim 8, wherein the first source electrodeincludes a first conductive material, and the first drain electrodeincludes a second conductive material different from the firstconductive material.
 11. The computing device of claim 8, wherein theTFT further includes: a top dielectric layer above the first sourceelectrode, the first drain electrode, and the first spacer, wherein thefirst spacer includes a first dielectric material, and the topdielectric layer includes a second dielectric material different fromthe first dielectric material.
 12. The computing device of claim 8,wherein the IC further includes: a gate dielectric layer above the firstgate electrode and below the channel layer; wherein the gate dielectriclayer includes silicon and oxygen, silicon and nitrogen, yttrium andoxygen, silicon, oxygen, and nitrogen, aluminum and oxygen, hafnium andoxygen, tantalum and oxygen, or titanium and oxygen.
 13. The computingdevice of claim 8, wherein the channel layer includes amorphous silicon,zinc (Zn), or oxygen (O).
 14. The computing device of claim 8, whereinthe IC is above an interconnect, and the interconnect is above asubstrate.